Application of PIXE for elemental analysis of ancient Chinese artifacts LiW & il B Beam
نویسندگان
چکیده
Proton induced X-ray emission (PIXE) is a well-known method for elemental analysis in many different specimens for various applied studies. In this paper, we report an application of PIXE analysis for a series of ancient Chinese coins from the Tang Dynasty to the Ming Dynasty (AD 618-1679). Ninety-six PIXE spectra were obtained from forty-eight samples of the ancient coins with the use of a Ge(Li) X-ray detector. On each sample two spots at different positions on the flat surface were irradiated per run by 3 MeV protons from a NEC 9SDH-2 pelletron tandem accelerator. The principal component elements (Cu, Pb, Sn and Zn) and others (Fe, Sb, Ni and As) were determined for the analyzed coins. Variations in composition with a time span of about one thousand years for the examined coins were observed. The results are presented and aspects of the evolution of Chinese metallurgy in casting coins are discussed.
منابع مشابه
Particle Induced X-ray Emission (PIXE): A Tool of Qualitative Elemental Analysis for Biological Sample
The facility of ion beam laboratory at Kochi University of Technology (KUT) has been extended by installing the Particle Induced X-ray Emission (PIXE) technique, in order to provide qualitative and quantitative elemental analysis and in-air micro-PIXE analysis. This paper is a description of PIXE setup and its application in biological sample for qualitative elemental analysis. The energy calib...
متن کاملمیکروپیکسی: روشی توانمند در بررسی و تعیین مواد اولیه مصنوعات شیشهای دوره اشکانی کاخ شائور (شوش)
Investigation of scientific archaeological excavation reports in Iran indicated that these excavations yielded a large number of fragments of glass objects from many archaeological sites, but a very limited number of preliminary studies on elemental analysis of a few Iranian glass objects have been published. Also, a literature survey on pre-Islamic glass objects (especially from Parthian and S...
متن کاملThe scanning microbeam PIXE analysis facility at NIRS
In March 1999, a HVEE Tandetron was installed in the Electrostatic Accelerator Building of National Institute of Radiological Sciences (NIRS) for particle induced X-ray emission (PIXE) analysis. The specifications of the Tandetron accelerator system operating at NIRS are as follows: the accelerating voltage is 0.4–1.7 MV, and the maximum beam current is 500 nA at 3.4 MeV. The accelerator facili...
متن کاملApplication of PIXE and PIGE under variable ion beam incident angle to several fields of archaeometry
For several years, the specific features of PIXE and PIGE have made them very attractive in the field of archaeometry. Among them, non-destructivity is one of the most important. The possibility of working under atmospheric pressure is also important because of the very different shapes and sizes of the artefacts concerned. However, these ion beam techniques suffer from the same disadvantage: t...
متن کاملArtifact reduction techniques in Cone Beam Computed Tomography (CBCT) imaging modality
Introduction: Cone beam computed tomography (CBCT) was introduced and became more common based on its low cost, fast image procedure rate and low radiation dose compared to CT. This imaging modality improved diagnostic and treatment-planning procedures by providing three-dimensional information with greatly reduced level of radiation dose compared to 2D dental imaging modalitie...
متن کامل